| Features: |
| Modular design: May be configured individually to a wide variety of applications. |
| Multi-format sync capability: 19 HD formats in addition to PAL, NTSC and standard definition SDI systems. |
| Master application with internal or external high stability reference. |
| VariTime™ subnanosecond delay Compensation. |
| Full genlock capability: 1 frame for HD; 2 fields for SDI; 4 or 8 fields for NTSC and PAL. |
| GPS Genlock and LTC Generator Option. |
| Up to 8 individually timed HD and SD serial digital outputs and 2 SD serial digital outputs |
| Up to 12 individually timed Tri-level sync outputs. |
| Dual Link HD-SD Test Signal Generator |
| Backwards compatibility with modules for PT5230 and PT5210. |
| Analogue outputs in combination with SDI outputs. |
| Embedded audio in HD and SD serial digital outputs. |
Dual AES3/EBU digital audio generator.
Separate Word-clock output. |
| "Lip Sync" moving element in SDI test patterns synchronised to embedded audio "click". |
| Philips Circle pattern or FuBK test pattern. |
| Programmable text strings in test pattern generators can be placed on the screen where needed. |
| Time and date option for test pattern generators. |
| Available in SD only or HD-SD configuration. |
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